Scanning electron microscope image of the scanning probe microscope Silicon nitride sharp probe. At 99300x magnification. An apex radius of just 7 nm is typical. Copyright: Mohammad Fardin Gholami and Johannes Müller

Scanning electron microscope image of the scanning probe microscope Silicon nitride sharp probe. At 5900x magnification. Cutting through a soft silicon rubber compund layer. Copyright: Mohammad Fardin Gholami and Johannes Müller

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