Scanning electron microscope image of the scanning probe microscope Silicon nitride sharp probe. At 5900x magnification. Cutting through a soft silicon rubber compund layer. Copyright: Mohammad Fardin Gholami and Johannes Müller

Scanning force microscope (topography) image of single Graphite layer (Graphene) deposited onto Muscovite Mica crystal and Cut by applied shear force using scanning probe microscope sharp tip. Magnification of 80500x in image 1. Copyright: Mohammad Fardin Gholami

Scanning force microscope (topography) image of single dendronized polymer chains deposited onto Muscovite Mica crystal and Cut of the polymer chain by applied shear force using scanning probe microscope sharp tip. Magnification of 357000x. Copyright: Mohammad Fardin Gholami